IEEE - Institute of Electrical and Electronics Engineers, Inc. - Optical reflectometry for in-situ monitoring of carbon nanotubes deposition by optical tweezers

2007 Quantum Electronics and Laser Science Conference

Author(s): Ken Kashiwagi ; Shinji Yamashita ; Sze Yun Set
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2007
Conference Location: Baltimore, MD, USA, USA
Conference Date: 6 May 2007
Page(s): 1 - 2
ISBN (CD): 978-1-55752-834-6
DOI: 10.1109/QELS.2007.4431161
Regular:

Reflectometry is adopted for in-situ monitoring of carbon nanotubes deposition to fiber end by optical tweezers. Reflectivity increases drastically once CNTs are deposited, and enhancement of... View More

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