IEEE - Institute of Electrical and Electronics Engineers, Inc. - A total internal reflection technique for time resolved measurements of index of refraction

2007 Quantum Electronics and Laser Science Conference

Author(s): John R. Houser ; Aaron C. Bernstein ; Todd Ditmire
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2007
Conference Location: Baltimore, MD, USA, USA
Conference Date: 6 May 2007
Page(s): 1 - 2
ISBN (CD): 978-1-55752-834-6
DOI: 10.1109/QELS.2007.4431147
Regular:

We present a method using total-internal reflection for measuring small index-of-refraction changes (Δn=1x10-5). The technique overcomes requirements of diffraction-limited laser... View More

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