IEEE - Institute of Electrical and Electronics Engineers, Inc. - Classification framework for nailfold capillary microscopy images

TENCON 2007 - 2007 IEEE Region 10 Conference

Author(s): Chia-Hsien Wen ; Wei-Duen Liao ; Kuan-Ching Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Taipei, Taiwan
Conference Date: 30 October 2007
Page(s): 1 - 4
ISBN (CD): 978-1-4244-1272-3
ISBN (Paper): 978-1-4244-1271-6
DOI: 10.1109/TENCON.2007.4428910
Regular:

Nailfold capillary microscopy examination has been used since late 1950s as a non-invasive in-vivo technique for diagnosing and monitoring connective tissue disease in adults. Disorders such as... View More

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