IEEE - Institute of Electrical and Electronics Engineers, Inc. - Measuring Overlap-rate in a Hierarchical Approach for Color Image Segmentation

2007 Second International Conference on Innovative Computing, Information and Control

Author(s): Zhiling Hong ; Qingshan Jiang ; Shengrui Wang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Kumamoto, Japan
Conference Date: 5 September 2007
Page(s): 554
ISBN (Paper): 0-7695-2882-1
DOI: 10.1109/ICICIC.2007.380
Regular:

In this paper, we present a new theory regarding cluster overlap, which allows for the computation of a cluster overlap rate that turns out being a very good measure of similarity between... View More

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