IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Fault Diagnosis Method Based on Clone and Mutation Mechanisms
2007 Second International Conference on Innovative Computing, Information and Control
| Author(s): | Dou Wei ; Liu Zhan-sheng |
| Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
| Publication Date: | 1 September 2007 |
| Conference Location: | Kumamoto, Japan |
| Conference Date: | 5 September 2007 |
| Page(s): | 443 |
| ISBN (Paper): | 0-7695-2882-1 |
| DOI: | 10.1109/ICICIC.2007.22 |
Regular:
This paper presents a new diagnosis method based on the artificial immune clone and mutation mechanism to overcome the problems of excessive information rubbish and the gradual increase of new... View More
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