IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Fault Diagnosis Method Based on Clone and Mutation Mechanisms

2007 Second International Conference on Innovative Computing, Information and Control

Author(s): Dou Wei ; Liu Zhan-sheng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Kumamoto, Japan
Conference Date: 5 September 2007
Page(s): 443
ISBN (Paper): 0-7695-2882-1
DOI: 10.1109/ICICIC.2007.22
Regular:

This paper presents a new diagnosis method based on the artificial immune clone and mutation mechanism to overcome the problems of excessive information rubbish and the gradual increase of new... View More

Advertisement