IEEE - Institute of Electrical and Electronics Engineers, Inc. - Semi-soft Decision Decoding Based on Correspondence between Error Patterns and the Relative Test Patterns

2007 Second International Conference on Innovative Computing, Information and Control

Author(s): Hsin-Kun Lai ; Erl-Huei Lu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Kumamoto, Japan
Conference Date: 5 September 2007
Page(s): 396
ISBN (Paper): 0-7695-2882-1
DOI: 10.1109/ICICIC.2007.515
Regular:

A semi-soft decision decoding algorithm based on the correspondence between error patterns and the relative test patterns for binary linear block codes over AWGN channel is presented. The proposed... View More

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