IEEE - Institute of Electrical and Electronics Engineers, Inc. - On-Line Learning of Evolving Neural Models for Process Identification and Abnormality Detection

2007 Second International Conference on Innovative Computing, Information and Control

Author(s): G. Vachkov
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Kumamoto, Japan
Conference Date: 5 September 2007
Page(s): 382
ISBN (Paper): 0-7695-2882-1
DOI: 10.1109/ICICIC.2007.420
Regular:

In this paper a new algorithm for creating evolving neural models is proposed. Instead of repeating the "growing" and "pruning" steps during the learning, as in the most other known evolving... View More

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