IEEE - Institute of Electrical and Electronics Engineers, Inc. - Textile Web Defect Inspection by Feature Analysis Method

2007 Second International Conference on Innovative Computing, Information and Control

Author(s): Z. Musa ; T.A. Abdul Kadir ; R. Abu Bakar
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Kumamoto, Japan
Conference Date: 5 September 2007
Page(s): 376
ISBN (Paper): 0-7695-2882-1
DOI: 10.1109/ICICIC.2007.557
Regular:

Nowadays in the textile industry are still used a human naked eyes to detect any kinds of defect on textile webs. The problems occurred when a human has their own limitations on different kind of... View More

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