IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Goodness-of-Fit Test for GEE Models with Binary Longitudinal Data Based on Smoothing Methods

2007 Second International Conference on Innovative Computing, Information and Control

Author(s): Kuo-Chin Lin ; Yi-Ju Chen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Kumamoto, Japan
Conference Date: 5 September 2007
Page(s): 245
ISBN (Paper): 0-7695-2882-1
DOI: 10.1109/ICICIC.2007.28
Regular:

The logistic regression models have received widespread use for analyzing binary response data. In longitudinal studies, correlated data arise and such data are often analyzed by generalized... View More

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