IEEE - Institute of Electrical and Electronics Engineers, Inc. - Simulated Life Test Plans with Type-I Interval Censoring for the Gamma Lifetime Model

2007 Second International Conference on Innovative Computing, Information and Control

Author(s): Wanbo Lu ; Tzong-Ru Tsai
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Kumamoto, Japan
Conference Date: 5 September 2007
Page(s): 243
ISBN (Paper): 0-7695-2882-1
DOI: 10.1109/ICICIC.2007.520
Regular:

Most of the existing life test plans are developed under continuous inspection of the test items. However, a reduction in testing effort can be achieved by employing the Type-I interval censored... View More

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