IEEE - Institute of Electrical and Electronics Engineers, Inc. - Learning Vector Quantization Neural Networks for LED Wafer Defect Inspection

2007 Second International Conference on Innovative Computing, Information and Control

Author(s): Chuan-Yu Chang ; Chin-Huang Chang ; Chun-Hsi Li ; Mu Der Jeng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Kumamoto, Japan
Conference Date: 5 September 2007
Page(s): 229
ISBN (Paper): 0-7695-2882-1
DOI: 10.1109/ICICIC.2007.368
Regular:

Automatic visual inspection of defects plays an important role in industrial manufacturing with the benefits of low-cost and high accuracy. In light-emitting diode (LED) manufacturing, each die on... View More

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