IEEE - Institute of Electrical and Electronics Engineers, Inc. - Cumulative Count of Conforming Chart with Variable Sampling Intervals for Markov Dependent Production Processes

2007 Second International Conference on Innovative Computing, Information and Control

Author(s): Pei-Wen Chen ; Chuen-Sheng Cheng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Kumamoto, Japan
Conference Date: 5 September 2007
Page(s): 182
ISBN (Paper): 0-7695-2882-1
DOI: 10.1109/ICICIC.2007.233
Regular:

The cumulative count of conforming (CCC) chart is received amount of attention for automatically manufacturing processes recently. The CCC chart with variable sampling intervals... View More

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