IEEE - Institute of Electrical and Electronics Engineers, Inc. - Structure Damages Detection Based On Genetic Algorithm with Experimental Validation

2007 Second International Conference on Innovative Computing, Information and Control

Author(s): Huijian Li ; Changjun He ; Yin Xiaozhan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Kumamoto, Japan
Conference Date: 5 September 2007
Page(s): 76
ISBN (Paper): 0-7695-2882-1
DOI: 10.1109/ICICIC.2007.543
Regular:

This paper describes a procedure about detecting of beam-like structural damage using a genetic algorithm with experimental validation. Firstly, the decreases of element stiffness is employed as... View More

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