IEEE - Institute of Electrical and Electronics Engineers, Inc. - The Bulk Built In Current Sensor Approach for Single Event Transient Detection

2007 International Symposium on System-on-Chip

Author(s): G. Wirth ; C. Fayomi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2007
Conference Location: Tampere, Finland
Conference Date: 20 November 2007
Page(s): 1 - 4
ISBN (CD): 978-1-4244-1368-3
ISBN (Paper): 978-1-4244-1367-6
ISSN (CD): 07EX1846C
ISSN (Paper): 07EX1846
DOI: 10.1109/ISSOC.2007.4427422
Regular:

Radiation effects, particularly single event transients (SETs), are increasingly affecting the reliability of integrated circuits as device dimensions are scaling down. This paper presents the use... View More

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