IEEE - Institute of Electrical and Electronics Engineers, Inc. - Random Jump Index: A Trustworthy Index for Random Insertion

CIS Workshops 2007. International Conference on Computational Intelligence and Security Workshops

Author(s): He Huang ; Fengchen Liu ; Qingwen Liu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2007
Conference Location: Heilongjiang, China
Conference Date: 15 December 2007
Page(s): 464 - 467
ISBN (Paper): 978-0-7695-3073-4
DOI: 10.1109/CISW.2007.4425534
Regular:

This paper presents an improved structure of Jump Index for trustworthy key search retention, called Random Jump Index. Unlike Jump Index, in which sequences must be strictly monotonically... View More

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