IEEE - Institute of Electrical and Electronics Engineers, Inc. - Study on early fast assessment system of disaster and loss caused by earthquake based on GIS

2007 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2007

Author(s): Jun He ; Shijun Chen ; Aixia Dou
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2007
Conference Location: Barcelona, Spain
Conference Date: 23 July 2007
Page(s): 4,726 - 4,728
ISBN (CD): 978-1-4244-1212-9
ISBN (Paper): 978-1-4244-1211-2
DOI: 10.1109/IGARSS.2007.4423915
Regular:

The basic principle of early fast earthquake disaster and loss assessment is introduced in the paper. Then the main functions and software development based on GIS and database management to... View More

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