IEEE - Institute of Electrical and Electronics Engineers, Inc. - A study on the spatial scaling properties of topographic index for China

2007 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2007

Author(s): Bin Yong ; Wanchang Zhang ; Dengzhong Zhao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2007
Conference Location: Barcelona, Spain
Conference Date: 23 July 2007
Page(s): 4,534 - 4,537
ISBN (CD): 978-1-4244-1212-9
ISBN (Paper): 978-1-4244-1211-2
DOI: 10.1109/IGARSS.2007.4423865
Regular:

Topographic Index (TI), ln(alpha/tanbeta) (alpha= upslope contributing area per unit contour; tanbeta= local slope angle), as an important parameter approximately characterizing the likely spatial... View More

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