IEEE - Institute of Electrical and Electronics Engineers, Inc. - Benchmarking: The end of the process

2007 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2007

Author(s): K. Verne ; T. Haithcoat ; V. Likholetov ; C. Hutchinson ; S. Drake ; W. Van Leeuwen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2007
Conference Location: Barcelona, Spain
Conference Date: 23 July 2007
Page(s): 2,211 - 2,212
ISBN (CD): 978-1-4244-1212-9
ISBN (Paper): 978-1-4244-1211-2
DOI: 10.1109/IGARSS.2007.4423277
Regular:

A typical NASA Applied Sciences Program project will involve transformation of a partner's national, state, or local decision support system (DSS) to accept and use new NASA research products. The... View More

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