IEEE - Institute of Electrical and Electronics Engineers, Inc. - Persistent scatterer density improvement using adaptive deformation models

2007 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2007

Author(s): F.J. van Leijen ; R.F. Hanssen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2007
Conference Location: Barcelona, Spain
Conference Date: 23 July 2007
Page(s): 2,102 - 2,105
ISBN (CD): 978-1-4244-1212-9
ISBN (Paper): 978-1-4244-1211-2
DOI: 10.1109/IGARSS.2007.4423248
Regular:

Because the quality assessment of Persistent Scatterers (PS) is dependent on the deformation model chosen, PS may be falsely rejected due to model imperfections. To accept these PS, more advanced... View More

Advertisement