IEEE - Institute of Electrical and Electronics Engineers, Inc. - A statistical and theoretical study about radar sensitivity to crop growth from S to X band

2007 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2007

Author(s): A.D. Vecchia ; P. Ferrazzoli ; L. Guerriero ; T. Strozzi ; U. Wegmuller
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2007
Conference Location: Barcelona, Spain
Conference Date: 23 July 2007
Page(s): 1,424 - 1,427
ISBN (CD): 978-1-4244-1212-9
ISBN (Paper): 978-1-4244-1211-2
ISSN (Electronic): 2153-7003
ISSN (Paper): 2153-6996
DOI: 10.1109/IGARSS.2007.4423074
Regular:

In this work, we show the correlation study carried out on the data collected on a maize field in the Swiss region named Central Plain, by the multifrequency RASAM scatterometer. This agricultural... View More

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