IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analsis of historical AVHRR PATMOS aerosol data in support of the long-term trend study

2007 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2007

Author(s): T.X.-P. Zhao ; I. Laszlo ; A. Heidinger ; Changyong Cao ; D. Tarplay ; J. Sullivan ; Wei Guo ; A. Jelenak
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2007
Conference Location: Barcelona, Spain
Conference Date: 23 July 2007
Page(s): 1,071 - 1,074
ISBN (CD): 978-1-4244-1212-9
ISBN (Paper): 978-1-4244-1211-2
DOI: 10.1109/IGARSS.2007.4422986
Regular:

The long-term trend of aerosol optical thickness (AOT) over the global oceans has been studied by using a nearly 25-year aerosol record from the Advanced Very High Resolution Radiometer (AVHRR)... View More

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