IEEE - Institute of Electrical and Electronics Engineers, Inc. - Clutter analysis of high resolution millimeter-wave SAR-data in the spatial and wavelet domain

2007 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2007

Author(s): P. Wellig ; K. Schmid ; H. Essen ; A. Kurz ; H. Schimpf ; T. Brehm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2007
Conference Location: Barcelona, Spain
Conference Date: 23 July 2007
Page(s): 559 - 562
ISBN (CD): 978-1-4244-1212-9
ISBN (Paper): 978-1-4244-1211-2
DOI: 10.1109/IGARSS.2007.4422855
Regular:

This paper presents the analysis of high resolution millimeter SAR clutter data, measured in a joint Swiss-German flight campaign. The generalized Gaussian function and the Kolmogorov-Smirnov test... View More

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