IEEE - Institute of Electrical and Electronics Engineers, Inc. - Single charge detection using single-walled carbon nanotube single-hole transistor

International Semiconductor Device Research Symposium

Author(s): T. Kamimura ; Y. Ohno ; K. Matsumoto
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2007
Conference Location: College Park, MD, USA
Conference Date: 12 December 2007
Page(s): 1 - 2
ISBN (CD): 978-1-4244-1892-3
ISBN (Paper): 978-1-4244-1891-6
DOI: 10.1109/ISDRS.2007.4422494
Regular:

By using the single hole transistor (SHT), we have succeeded in detecting the single charge transition near the channel of single-walled carbon nanotube (SWNT). Abrupt discrete switching of the... View More

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