IEEE - Institute of Electrical and Electronics Engineers, Inc. - An Early Warning System for Technological Innovation Risk Management Using Artificial Neural Networks

2007 International Conference on Management Science and Engineering

Author(s): Hao Yun-hong ; Li Wen-bo ; Xu Xiu-ling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2007
Conference Location: Harbin, China
Conference Date: 20 August 2007
Page(s): 2,128 - 2,133
ISBN (CD): 978-7-88358-080-5
ISBN (Paper): 978-7-5603-2278-0
DOI: 10.1109/ICMSE.2007.4422154
Regular:

With the advent of knowledge-based economy, technological innovation is becoming more and more important and it is widely regarded as a key ingredient in business success. However, under a complex... View More

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