IEEE - Institute of Electrical and Electronics Engineers, Inc. - Robust facial element extraction under lighting variation

SICE '07. 46th SICE Annual Conference

Author(s): H. Tsuboi ; H. Saji
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Takamatsu, Japan
Conference Date: 17 September 2007
Page(s): 2,064 - 2,067
ISBN (CD): 978-4-907764-27-2
DOI: 10.1109/SICE.2007.4421327
Regular:

It is important, in biometrics and human-computer interaction (HCI), to extract features stably from facial elements. In this study, we propose a robust method of extracting facial elements under... View More

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