IEEE - Institute of Electrical and Electronics Engineers, Inc. - Micron Scale Measurement of a Crack Origin in a Metal Brittle Fracture

2007 18th International Symposium on Micro-NanoMechatronics and Human Science

Author(s): Y. Yamaguchi ; Y. Kato ; K. Ogata
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2007
Conference Location: Nagoya, Japan
Conference Date: 11 November 2007
Page(s): 249 - 254
ISBN (CD): 978-1-4244-1858-9
ISBN (Paper): 978-1-4244-1857-2
DOI: 10.1109/MHS.2007.4420861
Regular:

The goal of this research is to develop a micron scale measurement method, which, based on computer vision technology, gauges the crack origin and its extensions in a metal brittle fracture. It is... View More

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