IEEE - Institute of Electrical and Electronics Engineers, Inc. - A novel gray clustering algorithms for diagnosing aircraft faults

International Conference on Wavelet Analysis and Pattern Recognition, ICWAPR '07

Author(s): Hong Geng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2007
Conference Location: Beijing, China
Conference Date: 2 November 2007
Volume: 2
Page(s): 857 - 861
ISBN (CD): 978-1-4244-1066-8
ISBN (Paper): 978-1-4244-1065-1
DOI: 10.1109/ICWAPR.2007.4420789
Regular:

A fault description is used to find out fault causes in the line maintenance .A fault description usually results in several fault causes with fault isolation methods .The manufacturer's... View More

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