IEEE - Institute of Electrical and Electronics Engineers, Inc. - Determination of the feedback capacity of a low voltage trench gate MOSFET from dynamic measurements

2007 European Conference on Power Electronics and Applications

Author(s): V. Hoch ; M. Lubbers ; J. Petzoldt ; M. Heeb ; H. Jacobs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Aalborg, Denmark
Conference Date: 2 September 2007
Page(s): 1 - 9
ISBN (CD): 978-92-75815-10-8
DOI: 10.1109/EPE.2007.4417353
Regular:

Information on transient transistor capacities - especially on the feedback capacity - is not only important for the calculation of switching losses and the driver design of automotive electronics... View More

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