IEEE - Institute of Electrical and Electronics Engineers, Inc. - Robustness and turn-off losses of high voltage IGBT

2007 European Conference on Power Electronics and Applications

Author(s): H.-G. Eckel ; M.M. Bakran
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Aalborg, Denmark
Conference Date: 2 September 2007
Page(s): 1 - 10
ISBN (CD): 978-92-75815-10-8
DOI: 10.1109/EPE.2007.4417229
Regular:

A simple model for the turn-off of high voltage IGBTs with long carrier lifetime is derived from the device physics. It is used to get a better understanding of the behavior of the device during... View More

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