IEEE - Institute of Electrical and Electronics Engineers, Inc. - Pb-free Solder: SAC105 vs SAC305 Drop-Test Reliability Data Comparison

2007 32nd IEEE/CPMT International Electronic Manufacturing Technology Symposium

Author(s): G. Iyer ; E. Ouyang ; W. Kittidacha ; S. Tantideeravit ; L.K. Suresh
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: San Jose, CA, USA
Conference Date: 3 October 2007
Page(s): 251 - 255
ISBN (CD): 978-1-4244-1336-2
ISBN (Paper): 978-1-4244-1335-5
ISSN (Paper): 1089-8190
DOI: 10.1109/IEMT.2007.4417072
Regular:

With Pb-free RoHS compliance already in place and with the limited reliability data available for the Pb-free solder, it is becoming very difficult for industry to find a suitable replacement for... View More

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