IEEE - Institute of Electrical and Electronics Engineers, Inc. - Sensitization of symbolic runs in real-time testing using the ORIS tool

12th IEEE International Conference on Emerging Technologies and Factory Automation

Author(s): L. Carnevali ; L. Sassoli ; E. Vicario
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Patras, Greece
Conference Date: 25 September 2007
Page(s): 85 - 92
ISBN (CD): 978-1-4244-0826-9
ISBN (Paper): 978-1-4244-0825-2
DOI: 10.1109/EFTA.2007.4416757
Regular:

We address the problem of test case selection and path sensitization in the process of testing real-time preemptive systems, following a formal methodology based on the theory of preemptive Time... View More

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