IEEE - Institute of Electrical and Electronics Engineers, Inc. - Embedded model control: principles and applications. part II

12th IEEE International Conference on Emerging Technologies and Factory Automation

Author(s): E. Canuto ; L.D. Prieto
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Patras, Greece
Conference Date: 25 September 2007
Page(s): 53 - 60
ISBN (CD): 978-1-4244-0826-9
ISBN (Paper): 978-1-4244-0825-2
DOI: 10.1109/EFTA.2007.4416753
Regular:

In this second part, model error analysis is further pursued with the help of two theorems. The former one says how to retrieve noise in real-time so as to update Embedded Model. The source can... View More

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