IEEE - Institute of Electrical and Electronics Engineers, Inc. - An improved nonlinear empirical model applied to RF SOI LDMOSFET

2007 7th International Conference on ASIC Proceeding

Author(s): Jia He ; Ling-Ling Sun ; Jun Liu ; Wen-Jun Li ; Yan-Ming Wu ; Wen-Jie Xu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Guilin, China
Conference Date: 22 October 2007
Page(s): 1,142 - 1,145
ISBN (CD): 978-1-4244-1132-0
ISBN (Paper): 978-1-4244-1131-3
DOI: 10.1109/ICASIC.2007.4415835
Regular:

This paper introduced a RF SOI LOMOS nonlinear empirical model and the method of its parameters extraction. We realized the whole model by coding it with Verilog-A language and validated the model... View More

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