IEEE - Institute of Electrical and Electronics Engineers, Inc. - Leakage power reduction through dual V th assignment considering threshold voltage variation

2007 7th International Conference on ASIC Proceeding

Author(s): Xukai Shen ; Yu Wang ; Rong Luo ; Huazhong Yang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Guilin, China
Conference Date: 22 October 2007
Page(s): 1,122 - 1,125
ISBN (CD): 978-1-4244-1132-0
ISBN (Paper): 978-1-4244-1131-3
DOI: 10.1109/ICASIC.2007.4415830
Regular:

In today's sub-100nm CMOS technologies, leakage current has become an important part of the total power consumption, affecting both yields and lifetime of digital circuits. Dual Vth assignment,... View More

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