IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Novel Multi-Capture Scan Testing

2007 7th International Conference on ASIC Proceeding

Author(s): Xinning Liu ; Jun Yang ; Xiaojing Wen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Guilin, China
Conference Date: 22 October 2007
Page(s): 1,018 - 1,021
ISBN (CD): 978-1-4244-1132-0
ISBN (Paper): 978-1-4244-1131-3
DOI: 10.1109/ICASIC.2007.4415806
Regular:

System-on-a-chip is getting more and more popular in consumer and communication domains. The manufacturing test of SoC needs smart and economic test strategies. A novel scan testing method based... View More

Advertisement