IEEE - Institute of Electrical and Electronics Engineers, Inc. - A new soft IP core for online-testing and fault-tolerant structures

2007 7th International Conference on ASIC Proceeding

Author(s): Wang Wei ; Jiang Jianhui
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Guilin, China
Conference Date: 22 October 2007
Page(s): 1,006 - 1,009
ISBN (CD): 978-1-4244-1132-0
ISBN (Paper): 978-1-4244-1131-3
DOI: 10.1109/ICASIC.2007.4415803
Regular:

This paper presents a new soft IP core to construct online-testing and fault-tolerant structures, designs some example structures with commonly-used combinational circuits as CUTs, and analyzes... View More

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