IEEE - Institute of Electrical and Electronics Engineers, Inc. - A novel ESD protection circuit for ultra-deep-submicron low power mixed-signal IC designs

2007 7th International Conference on ASIC Proceeding

Author(s): Ta-Lee Yu ; Li-Hsien Fan ; Huijuan Cheng ; Jing Liu ; Xianmin Chen ; Jingjing Wang ; Ying Ma ; P. OuYang ; A. Guo ; J. Ji ; T. Qin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Guilin, China
Conference Date: 22 October 2007
Page(s): 387 - 390
ISBN (CD): 978-1-4244-1132-0
ISBN (Paper): 978-1-4244-1131-3
DOI: 10.1109/ICASIC.2007.4415648
Regular:

A novel ESD protection scheme for thinner gate-oxide core devices in ultra-deep-sub-micron process will be illustrated. The novel ESD protection scheme has demonstrated significant ESD... View More

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