IEEE - Institute of Electrical and Electronics Engineers, Inc. - ESD and latchup: Computer aided design (CAD) tools and methodologies for today and future VLSI designs

2007 7th International Conference on ASIC Proceeding

Author(s): S.H. Voldman
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Guilin, China
Conference Date: 22 October 2007
Page(s): 375 - 378
ISBN (CD): 978-1-4244-1132-0
ISBN (Paper): 978-1-4244-1131-3
DOI: 10.1109/ICASIC.2007.4415645
Regular:

In summary, new methods for ESD and latchup analysis are being utilized to address today's technical problems in products, and design tools. As semiconductor tool and product complexity increases,... View More

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