IEEE - Institute of Electrical and Electronics Engineers, Inc. - P1D-1 A Rapid Method for Classification of Interfacial Processes Using Multi-Harmonic Thickness Shear Mode(MTSM) Sensors

2007 IEEE Ultrasonics Symposium

Author(s): E. Ergezen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: New York, NY, USA
Conference Date: 28 October 2007
Page(s): 1,357 - 1,360
ISBN (CD): 978-1-4244-1384-3
ISBN (Paper): 978-1-4244-1383-6
ISSN (Paper): 1051-0117
DOI: 10.1109/ULTSYM.2007.341
Regular:

This paper describes a novel technique to analyze the response of multi-harmonic thickness shear mode (MTSM) sensor. In this method a MTSM sensor was operated not only at its fundamental frequency... View More

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