IEEE - Institute of Electrical and Electronics Engineers, Inc. - P1D-1 A Rapid Method for Classification of Interfacial Processes Using Multi-Harmonic Thickness Shear Mode(MTSM) Sensors
2007 IEEE Ultrasonics Symposium
Author(s): | E. Ergezen |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 October 2007 |
Conference Location: | New York, NY, USA |
Conference Date: | 28 October 2007 |
Page(s): | 1,357 - 1,360 |
ISBN (CD): | 978-1-4244-1384-3 |
ISBN (Paper): | 978-1-4244-1383-6 |
ISSN (Paper): | 1051-0117 |
DOI: | 10.1109/ULTSYM.2007.341 |
Regular:
This paper describes a novel technique to analyze the response of multi-harmonic thickness shear mode (MTSM) sensor. In this method a MTSM sensor was operated not only at its fundamental frequency... View More