IEEE - Institute of Electrical and Electronics Engineers, Inc. - Assembly Planning and Assembly Sequences Combination Using Assembly Feature Interference

2007 10th IEEE International Conference on Computer Aided Design and Computer Graphics

Author(s): Jihong Liu ; Yong Wang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Beijing, China
Conference Date: 15 October 2007
Page(s): 545 - 548
ISBN (CD): 978-1-4244-1579-3
ISBN (Paper): 978-1-4244-1578-6
DOI: 10.1109/CADCG.2007.4407951
Regular:

Assembly planning and assembly sequences combination based on assembly feature interference is proposed and assembly feature interference is introduced as the assembly constraints. Firstly, the... View More

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