IEEE - Institute of Electrical and Electronics Engineers, Inc. - HDD-level electrostatic discharge (ESD) failure voltage of tunneling magnetoresisive (TMR) heads

29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

Author(s): Eunkyu Jang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Anaheim, CA, USA
Conference Date: 16 September 2007
ISBN (Paper): 978-1-58537-136-5
DOI: 10.1109/EOSESD.2007.4401745
Regular:

HDD-level electrostatic discharge (ESD) failure voltage of drives equipped with TMR heads and flying height control heaters is measured. An ESD gun is used up to 30 kV to simulate ESD events on... View More

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