IEEE - Institute of Electrical and Electronics Engineers, Inc. - Mechanical properties characterization of individual yeast cells using environment-SEM nanomanipulation system

2007 IEEE/RSJ International Conference on Intelligent Robots and Systems

Author(s): M.R. Ahmad ; M. Nakajima ; S. Kojima ; M. Homma ; T. Fukuda
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: San Diego, CA, USA
Conference Date: 29 October 2007
Page(s): 596 - 601
ISBN (CD): 978-1-4244-0912-9
ISBN (Paper): 978-1-4244-0911-2
DOI: 10.1109/IROS.2007.4399639
Regular:

We performed in situ measurements of mechanical properties of individual W303 wild-type yeast cells by using an integrated environmental scanning electron microscope (ESEM) - nanomanipulator... View More

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