IEEE - Institute of Electrical and Electronics Engineers, Inc. - Statistics of Speckle in Ultrasound B-Scans

Author(s): R.F. Wagner ; S.W. Smith ; J.M. Sandrik ; H. Lopez
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 1983
Volume: 30
Page(s): 156 - 163
ISSN (Paper): 0018-9537
DOI: 10.1109/T-SU.1983.31404
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