IEEE - Institute of Electrical and Electronics Engineers, Inc. - Impact ionization of sub-micron InP structures

LEOS 2007. 20th Annual Meeting of the IEEE Lasers and Electro-Optics Society

Author(s): L.J.J. Tan ; J.S. Ng ; C.H. Tan ; J.P.R. David
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Lake Buena Vista, FL, USA
Conference Date: 21 October 2007
Page(s): 515 - 516
ISBN (CD): 978-1-4244-0925-9
ISBN (Paper): 978-1-4244-0924-2
ISSN (Paper): 1092-8081
DOI: 10.1109/LEOS.2007.4382506
Regular:

In this work, InP ionization coefficients and threshold energies of electrons and holes were deduced from Me, Fe, Mh and Fh measured on a series of InP... View More

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