IEEE - Institute of Electrical and Electronics Engineers, Inc. - Photogrammetric Recession Measurements of Ablative Materials in the NASA Ames Sixty-Megawatt Arcjet

22nd International Congress on Instrumentation in Aerospace Simulation Facilities, 2007. ICIASF 2007

Author(s): E.T. Schairer ; J.T. Heineck
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2007
Conference Location: Pacific Grove, CA, USA
Conference Date: 10 June 2007
Page(s): 1 - 10
ISBN (CD): 978-1-4244-1600-4
ISBN (Paper): 978-1-4244-1599-1
DOI: 10.1109/ICIASF.2007.4380875
Regular:

The photogrammetric recession measurement (PRM) technique has been applied in several tests of ablative thermal-protection system materials in the 60-MW arcjet at NASA Ames Research Center. This... View More

Advertisement