IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault Models and Yield Analysis for QCA-Based PLAs

2007 International Conference on Field Programmable Logic and Applications, FPL 2007

Author(s): M. Crocker ; X.S. Hu ; M. Niemier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2007
Conference Location: Amsterdam, Netherlands
Conference Date: 27 August 2007
Page(s): 435 - 440
ISBN (CD): 978-1-4244-1060-6
ISBN (Paper): 978-1-4244-1059-0
DOI: 10.1109/FPL.2007.4380685
Regular:

Various implementations of the quantum-dot cellular automata (QCA) device architecture may help many performance scaling trends continue as we approach the nano-scale. Experimental success has led... View More

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