IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Framework on Mitigating Single Event Upset using Delay-Insensitive Asynchronous Circuits

2007 IEEE Region 5 Technical Conference

Author(s): Jia Di
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2007
Conference Location: Fayetteville, AR, USA
Conference Date: 20 April 2007
Page(s): 354 - 357
ISBN (CD): 978-1-4244-1280-8
ISBN (Paper): 978-1-4244-1279-2
DOI: 10.1109/TPSD.2007.4380334
Regular:

This framework is a circuit design technique for single event upset (SEU) immunity using delay-insensitive asynchronous logic. SEU can cause a transient fault which, if memorized, will become a... View More

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