IEEE - Institute of Electrical and Electronics Engineers, Inc. - Overinstrumented Systems

2007 IEEE Region 5 Technical Conference

Author(s): L. Alvergue ; X. Li ; J. Aravena
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2007
Conference Location: Fayetteville, AR, USA
Conference Date: 20 April 2007
Page(s): 326 - 330
ISBN (CD): 978-1-4244-1280-8
ISBN (Paper): 978-1-4244-1279-2
DOI: 10.1109/TPSD.2007.4380329
Regular:

Advances in sensors and instrumentation have enabled the measurement of variables once thought to be inaccessible. Moreover, sensors have such high reliability that one can safely assume they will... View More

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