IEEE - Institute of Electrical and Electronics Engineers, Inc. - Challenges in Reliability Assessment of Advanced CMOS Technologies

14th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2007

Author(s): G. Groeseneken ; R. Degraeve ; B. Kaczer ; P. Roussel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2007
Conference Location: Bangalore, India
Conference Date: 11 July 2007
Page(s): 1 - 9
ISBN (CD): 978-1-4244-1015-6
ISBN (Paper): 978-1-4244-1014-9
DOI: 10.1109/IPFA.2007.4378048
Regular:

In this paper it was demonstrated that by applying the classical way of reliability lifetime prediction, the reliability of a product can no longer be guaranteed in some cases and for some failure... View More

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