IEEE - Institute of Electrical and Electronics Engineers, Inc. - Calculating risk of integration relations in application landscapes

2007 IEEE International Conference on Electro/Information Technology

Author(s): M. Fathi ; A. Holland ; R. Montino ; T. Schmidt ; H. Peuser
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2007
Conference Location: Chicago, IL, USA
Conference Date: 17 May 2007
Page(s): 210 - 214
ISBN (CD): 978-1-4244-0941-9
ISBN (Paper): 978-1-4244-0940-2
DOI: 10.1109/EIT.2007.4374515
Regular:

This paper presents an approach for calculating risk of integration relations between applications in an application landscape. For this, different attributes for documenting applications and... View More

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